Österreichische Post 5.99 DPD-Kurier 6.49 GLS-Kurier 4.49

Quality Conformance and Qualification of Microelec Microelectronic Packages & Interconnects

Sprache EnglischEnglisch
Buch Broschur
Buch Quality Conformance and Qualification of Microelec Microelectronic Packages & Interconnects Michael Pecht
Libristo-Code: 04892410
Verlag John Wiley & Sons Inc, Jänner 1995
All packaging engineers and technologists who want to ensure that they give their customers the high... Vollständige Beschreibung
? points 495 b
197.41 inkl. MwSt.
Externes Lager in kleiner Menge Wir versenden in 11-15 Tagen

30 Tage für die Rückgabe der Ware


Das könnte Sie auch interessieren


Abraham Terence E. Fretheim / Hardcover
common.buy 55.88
Healing Rhythms Sun Poong / Audio CD
common.buy 24.70
Virginia Woolf and the Bloomsbury Avant-garde Christine Froula / Hardcover
common.buy 136.38
Indiscernible Counterparts Christopher Braider / Broschur
common.buy 36.31
Pedagogical Imagination Leon Sachs / Hardcover
common.buy 82.41

All packaging engineers and technologists who want to ensure that they give their customers the highest quality, most cost--effective products should know that the paradigm has shifted. It has shifted away from the MIL--STDs and other government standards and test procedures that dona t cost--effectively address potential failure mechanisms or the manufacturing processes of the product. It has shifted decisively towards tackling the root causes of failure and the appropriate implementation of cost--effective process controls, qualityscreens, and tests. This booka s groundbreaking, science--based approach to developing qualification and quality assurance programs helps engineers reach a new level of reliability in todaya s high--performance microelectronics. It does this with powerful...aeo Techniques for identifying and modeling failure mechanisms earlier in the design cycle, breaking the need to rely on field data aeo Physics--of--failure product reliability assessment methods that can be proactively implemented throughout the design and manufacture of the product aeo Process controls that decrease variabilities in the end product and reduce end--of--line screening and testing A wide range of microelectronic package and interconnect configurations for both single--and multi--chip modules is examined, including chip and wire--bonds, tape--automated (TAB), flip--TAB, flip--chip bonds, high--density interconnects, chip--on--board designs (COB), MCM, 3--D stack, and many more. The remaining package elements, such as die attachment, case and lid, leads, and lid and lead seals are also discussed in detail. The product of a distinguished team of authors and editors, this booka s guidelines for avoiding potential high--risk manufacturing and qualification problems, as well as for implementing ongoing quality assurance, are sure to prove invaluable to both students and practicing professionals. For the professional engineer involved in the design and manufacture of products containing electronic components, here is a comprehensive handbook to the theory and methods surrounding the assembly of microelectronic and electronic components. The book focuses on computers and consumer electronic products with internal subsystems that reflect mechanical design constraints, cost limitations, and aesthetic and ergonomic concerns. Taking a total system approach to packaging, the book systematically examines: basic chip and computer architecture; design and layout; interassembly and interconnections; cooling scheme; materials selection, including ceramics, glasses, and metals; stress, vibration, and acoustics; and manufacturing and assembly technology. 1994 (0--471--53299--1) 800 pp. INTEGRATED CIRCUIT, HYBRID, AND MULTICHIP MODULE PACKAGE DESIGN GUIDELINES: A Focus on Reliability ----Michael Pecht This comprehensive guide features a uniquely organized time--phased approach to design, development, qualification, manufacture, and in--service management. It provides step--by--step instructions on how to define realistic system requirements, define the system usage environment, identify potential failure modes, characterize materials and processes by the key control label factors, and use experiment, step--stress, and accelerated methods to ensure optimum design before production begins. Topics covered include: detailed design guidelines for substrate...wire and wire, tape automated, and flip--chip bonding...element attachment and case, lead, lead and lid seals----incorporating dimensional and geometric configurations of package elements, manufacturing and assembly conditions, materials selection, and loading conditions. 1993 (0--471--59446--6) 454 pp.

Verschenken Sie dieses Buch noch heute
Es ist ganz einfach
1 Legen Sie das Buch in Ihren Warenkorb und wählen Sie den Versand als Geschenk 2 Wir schicken Ihnen umgehend einen Gutschein 3 Das Buch wird an die Adresse des beschenkten Empfängers geliefert

Anmeldung

Melden Sie sich bei Ihrem Konto an. Sie haben noch kein Libristo-Konto? Erstellen Sie es jetzt!

 
obligatorisch
obligatorisch

Sie haben kein Konto? Nutzen Sie die Vorteile eines Libristo-Kontos!

Mit einem Libristo-Konto haben Sie alles unter Kontrolle.

Erstellen Sie ein Libristo-Konto